DURIP: Piezoresponse Force Microscope (PFM) with Controlled Environment for Characterization of Flexoelectric Nanostructures

reportActive / Technical Report | Accession Number: ADA625299 | Open PDF

Abstract:

A piezo-force microscope PFM system was acquired under this support for characterization of flexoelectric micronanostructures in a controlled environment. The system was installed successfully and a few graduate students were trained by the vendor. Both piezoelectric samples and flexoelectric samples were prepared and characterized using this new system.

Author(s):
Huang, Wenbin ; Jiang, Xiaoning
Author Organization(s):
NORTH CAROLINA STATE UNIV AT RALEIGH
Descriptive Note:
Final rept. 1 Aug 2013-31 Jan 2015
Supplementary Note:
The original document contains color images.
Pagination:
0017

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
ARO-63366-EL-RIP.1
Contract/Grant Number(s):
W911NF-13-1-0253
Monitor Series:
63366-EL-RIP.1, ARO
 Subject Terms
Joint Capability Areas:
JCA_4.6_Engineering; JCA_1.2.3_Educating; JCA_5_Command and Control
Modernization Areas:
Microelectronics
Communities of Interest:
Advanced Electronics
Descriptor(s):
*MICROELECTROMECHANICAL SYSTEMS, *NANOSTRUCTURES, *PIEZOELECTRIC MATERIALS, ACOUSTIC DETECTION, BANDWIDTH, CANTILEVER BEAMS, COEFFICIENTS, DIELECTRIC PROPERTIES, ELECTRODES, FABRICATION, GRATINGS(SPECTRA), HIGH SENSITIVITY, INFRARED DETECTORS, LOW NOISE, MANGANESE OXIDES, MECHANICAL PROPERTIES, MICROSCOPES, MINIATURIZATION, MULTISENSORS, PASSIVE SYSTEMS, SINGLE CRYSTALS, THIN FILMS, VIBRATION ISOLATORS
Field(s)/Group(s):
Electrical and Electronic Equipment, Infrared Detection and Detectors, Active and Passive Radar Detection and Equipment, Crystallography, Electricity and Magnetism
Keyword(s):
PFM(PIEZO FORCE MICROSCOPE), FLEXOELECTRIC CHARACTERIZATION, SENSING MATERIALS, PE611103A
Report Date:
2015 Apr 21
Creation Date:
2016 Jan 13