Single Event Upset and Latchup Considerations for CMOS Devices Operated at 3.3 Volts

reportActive / Technical Report | Accession Number: ADA349539 | Open PDF

Abstract:

A comparison of single event upset and latchup test results for devices operated at several bias levels, from 2.5 V to 6 V, is reported. Vulnerability to SEU increased with decreasing bias, whereas the opposite pattern was observed for SEL. The relationship between threshold SEU vulnerability and bias is not regular, which precludes the use of simple prediction schemes for obtaining the expected vulnerability at 3.3 V from existing 5 V data.

Author(s):
Koga, R. ; Hansel, S. J. ; Crain, W. R. ; Crawford, K. B. ; Pinkerton, S. D. ; Quan, J. ; Maher, M.
Author Organization(s):
AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
Supplementary Note:
Prepared in collaboration with National Semiconductor Corporation, South Portland, ME. DOI: 10.21236/ADA349539
Pagination:
0008

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
TR-94(4940)-9, SMC-TR-98-20
Contract/Grant Number(s):
F04701-93-C-0094
Monitor Series:
TR-98-20, SMC
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_5.3_Planning; JCA_5.3.2_Apply Situational Understanding; JCA_3.2_Engagement; JCA_3_Force Application; JCA_6_Net Centric; JCA_3.2.1_Kinetic Means; JCA_6.1.3_Switching and Routing; JCA_6.4.1_Secure Information Exchange; JCA_8_Building Partnerships
Modernization Areas:
Microelectronics
Communities of Interest:
Advanced Electronics
Descriptor(s):
*LOGIC DEVICES, *COMPLEMENTARY METAL OXIDE SEMICONDUCTORS, AIR FORCE RESEARCH, PREDICTIONS, VULNERABILITY, IRRADIATION, BIAS, RADIATION EFFECTS, HEAVY IONS, COSMIC RAYS
Field(s)/Group(s):
Electrical and Electronic Equipment
Keyword(s):
*LATCHUP, *SINGLE EVENT UPSET, BIAS VOLTAGE DEPENDENCE, UPSET SENSITIVITY, MICROCIRCUITS IN SPACE, SEU(SINGLE EVENT UPSET), SINGLE EVENT SNAPBACK, SEL(SINGLE EVENT LATCHUP)
Report Date:
1998 Jan 15
Creation Date:
1998 Jul 29