Characterization and Calibration of a Pulsed Laser System for Single Event Upset Simulation.

Pepper, G. T.; Fechete, A.

Characterization and Calibration of a Pulsed Laser System for Single Event Upset Simulation.

Active / Technical Report | Accession Number: ADA290075 |

Abstract:

A pulsed Nd Glass laser facility that was developed at Defence Research Establishment Ottawa, for the simulation of single event upsets SEUs in electronics, is described in detail. The performance of the laser system, the associated instrumentation and data acquisition systems were extensively characterized during the process of studying the charge collected in a silicon p-i-n photodiode, due to laser and ion-induced SEU. Laser simulation of SEUs is demonstrated to be an accurate and convenient complementary method to ion accelerator-based SEU experimentation. MM

Author(s):

Pepper, G. T. ; Fechete, A.

Author Organization(s):

DEFENCE RESEARCH ESTABLISHMENT OTTAWA (ONTARIO)

Descriptive Note:

DREO rept.,

Pagination:

0044

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:

Approved For Public Release

RECORD

Collection: TR

Identifying Numbers

Report Number(s):

DREO-1241

Monitor Series:

XD

Subject Terms

Joint Capability Areas:

JCA_5_Command and Control; JCA_5.6.3_Assess Achievement of Objectives; JCA_5.6_Monitor; JCA_4.5.4_Requirements Definition; JCA_4.5_Operational Contract Support; JCA_5.3_Planning; JCA_1.2.7_Experimentation

Modernization Areas:

Microelectronics

Communities of Interest:

Energy and Power Technologies

Descriptor(s):

*SEMICONDUCTOR DEVICES, *PULSED LASERS, *ION ACCELERATORS, *GLASS LASERS, Q SWITCHING, SIMULATION, LASER BEAMS, DATA ACQUISITION, CALIBRATION, REFRACTION, PHOTODETECTORS, PHOTODIODES, PIN DIODES

Field(s)/Group(s):

Lasers and Masers, Particle Accelerators

Keyword(s):

SINGLE EVENT UPSET

Report Date:

1994 Nov 01