Effects of Heavy Ions on Microcircuits in Space: Recently Investigated Upset Mechanisms

reportActive / Technical Report | Accession Number: ADA201711 | Open PDF

Abstract:

Upset of microcircuits in space have been attributed to heavy ions. In recent studies of the failure mechanisms, we have employed a wide range of test methods. These studies and the application of the test results to space-borne microcircuits are presented. Keywords Cosmic ray damage Microcircuits in space Radiation effects Single event upset Space electronics.

Author(s):
Koga, Rokutaro ; Kolasinski, Wojciech A.
Author Organization(s):
AEROSPACE CORP EL SEGUNDO CA SPACE SCIENCES LAB
Descriptive Note:
Technical rept.
Supplementary Note:
DOI: 10.21236/ADA201711
Pagination:
0031

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
TR-0086(6940-05)-21, SD-TR-88-91
Contract/Grant Number(s):
F04701-85-C-0086
Monitor Series:
TR-88-91, SD
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control
Modernization Areas:
Microelectronics
Communities of Interest:
Advanced Electronics
Descriptor(s):
*DAMAGE, *HEAVY IONS, *RADIATION EFFECTS, *MICROCIRCUITS, *ELECTRONIC EQUIPMENT, *COSMIC RAYS, SPACEBORNE, TEST METHODS, FAILURE, TEST AND EVALUATION, RANGE(EXTREMES)
Field(s)/Group(s):
Electrical and Electronic Equipment, Particle Accelerators
Report Date:
1988 Oct 15