Burn-In of Uncased Semiconductors. A Feasibility Study.

reportActive / Technical Report | Accession Number: ADA092076 | Open PDF

Abstract:

The feasibility of burning-in uncased semiconductors has been demonstrated. Twelve quad 2-input NAND gates type 5400 have been burned-in for 168 hours at 125 C in accordance with MIL-STD-883, Method 1005-1, Test Condition A. Eleven of the devices were retrieved in a physical condition suitable for subsequent use in conventional assembly operations, the twelfth having a corner broken off. The design of the carrier assembly and the special tooling required for assembly are described. Author

Author(s):
Hearl, James E. ; Lukens, Samuel C.
Author Organization(s):
SERTECH LABS INC SALEM MA
Descriptive Note:
Final rept.,
Pagination:
0056

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
N00163-78-C-0332
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_5.3_Planning
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*SEMICONDUCTOR DEVICES, *NAND GATES, TOOLS, CHIPS(ELECTRONICS), RELIABILITY, OPERATION, ASSEMBLY
Field(s)/Group(s):
Electrical and Electronic Equipment, Manufacturing and Industrial Engineering and Control of Production Systems
Keyword(s):
Semiconductors(Uncased), Metalization, Assemblies(Carrier), Cases, Burn in, Quad gates, Tapes(Bumped)
Report Date:
1979 Nov 01