Comparison Study of the Five Transistor-Transistor-Logic (TTL) Families and Emitter Coupled Logic (ECL).

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Abstract:

This report describes the radiation test response of the five transistor-transistor-logic TTL technologies and the emitter-coupled-logic ECL technology. The five TTL technologies evaluated were Standard, High Speed, Low Power, Low Power Schottky, and Schottky. Quad dual input NAND TTL or NOR ECL gates and dual D flip-flops from each technology were tested. The devices were characterized for gamma dose-rate logic upset, total gamma dose survivability, and neutron fluence survivability. The data has been analyzed to provide a comparison of each logic technologys radiation response. Author

Author(s):
Knoll, Michael G.
Author Organization(s):
AIR FORCE WEAPONS LAB KIRTLAND AFB N MEX
Descriptive Note:
Final rept.,
Pagination:
0093

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AFWL-TR-78-5
Task Number(s):
20
Project Number(s):
WDNE
 Subject Terms
Joint Capability Areas:
JCA_3.2_Engagement; JCA_3_Force Application; JCA_3.2.1_Kinetic Means; JCA_5_Command and Control; JCA_1_Force Support; JCA_6.1.1_Wired Transmission; JCA_6_Net Centric; JCA_1.2_Force Preparation; JCA_1.2.3_Educating; JCA_6.1_Information Transport; JCA_5.2_Understand
Communities of Interest:
Advanced Electronics
Descriptor(s):
*LOGIC CIRCUITS, *EMITTERS, *TRANSISTOR TRANSISTOR LOGIC, COUPLING(INTERACTION), INTEGRATED CIRCUITS, GAMMA RAYS, FLIP FLOP CIRCUITS, SCHOTTKY BARRIER DEVICES, DOSE RATE, NAND GATES, NEUTRON IRRADIATION, NOR GATES
Field(s)/Group(s):
Electrical and Electronic Equipment, Nuclear Radiation Shielding, Protection and Safety
Keyword(s):
*Emitter Coupled Logic, ECL(Emitter Coupled Logic), Photoresponse, PE62704H, WUAFWLWDNE2001
Report Date:
1978 May 01