Local Light Polarization Mapping and Electromagnetic Field Imaging by SNOM

reportActive / Technical Report | Accession Number: ADP013090 | Open PDF

Abstract:

An influence of the incident light polarization on the aperture probe collection SNOM images have been investigated. Great difference between reflection SNOM images obtained at two orthogonal linear polarizations of the incident light have been observed. The SNOM images of domains and domain walls were studied. Three-dimensional light confinement near small hole in thin metallic film have been mapping by SNOM aperture probe.

Author(s):
Ejov, A. A. ; Muzychenko, D. A. ; Panov, V. I.
Author Organization(s):
MOSCOW STATE UNIV (RUSSIA) DEPT OF PHYSICS
Descriptive Note:
Conference proceedings
Supplementary Note:
This article is from Nanostructures: Physics and Technology Intl Symposium (8th), p. 333-335 This article is from ADA407315 Nanostructures: Physics and Technology International Symposium (8th) Held in St. Petersburg, Russia on June 19-23, 2000 Proceedings
Pagination:
0003

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Availability: Hard Copy Only.

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
NC.05P
Monitor Series:
X5
 Subject Terms
Communities of Interest:
Advanced Electronics
Descriptor(s):
*MICROSCOPY, *NANOSTRUCTURES, ELECTROMAGNETIC FIELDS, POLARIZATION, METAL FILMS, THIN FILMS, RUSSIA, LINEAR POLARIZATION, OPTICAL SCANNING, ORTHOGONALITY, DOMAIN WALLS
Field(s)/Group(s):
Atomic and Molecular Physics and Spectroscopy
Keyword(s):
COMPONENT REPORT, FOREIGN REPORTS, SNOM(SCANNING NEAR FIELD OPTICAL MICROSCOPY)
Report Date:
2000 Jun 23
Creation Date:
2002 Nov 20