Multilayer X-Ray Mirror Absolute Reflectivity, Energy Band Pass and Overlapping Order Determination Using an X-Ray Tube and a SI(LI) Detector,

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Abstract:

X-ray interference mirrors are a particular case of artificial multilayered media for which the wanted property is a high intensity of the diffraction phenomena itself. For such applications ons needs to know the performance of the mirrors at different wavelengths. We would like to demonstrate here how such X-ray reflectivity tests can be achieved on a laboratory apparatus to got absolute reflectivity and without the need of a synchrotron source.

Author(s):
Dhez, P. ; Duval, H. ; Malaurent, J. C.
Author Organization(s):
PARIS-11 UNIV ORSAY (FRANCE) LAB POUR L'UTILISATION DU RAYONNEMENT ELECTROMAG NETIQUE
Supplementary Note:
This article is from 'Physics of X-Ray Multilayer Structures' AD-A255 383, p138-141.
Pagination:
0004

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Monitor Series:
AFOSR
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*DIFFRACTION, *MIRRORS, *REFLECTIVITY, *X RAYS, *SILICON, HIGH INTENSITY, INTENSITY, INTERFERENCE, LABORATORIES, MEDIA, SYNCHROTRONS, TEST AND EVALUATION, LAYERS, DETECTORS, SPECULAR REFLECTION, ENERGY BANDS, BRAGG ANGLE, X RAY TUBES, PHOTONS, ANGLE OF INCIDENCE
Field(s)/Group(s):
Optics, Nuclear Physics and Elementary Particle Physics, Radiofrequency Wave Propagation, Inorganic Chemistry
Keyword(s):
Component Reports, Multilayers, Angular dispersive curve
Report Date:
1992 Mar 05