Laser Beam Induced Current (LBIC) Study of IR Detector Materials
Abstract:
Summary of activities and results 1. Demonstration of IR-LBIC spatial mapping of a MCT-FPA device using a 1450nm laser from both back and front sides 2. Unusual LBIC spatial mapping results of a MCT-FPA device from the front electrode side using a 532nm laser 3. Demonstration of LBIC spatial mapping of an InAsGaSb IR detector using a 532 nm laser at 10 K 4. PL spatial mapping of an isolated dislocation in GaAs, leading to general understanding of the interplay between point and extended defects on carrier diffusion in semiconductors 5. PL spatial mapping of Cd le epilayers with different growth conditions 6. PL spatial mapping of ZnTe epilayers with different growth conditions, from front surface and cleaved edge 7. MCT epilayer transmission and reflection measurements.