Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination

reportActive / Technical Report | Accession Number: ADA530608 | Open PDF

Abstract:

Energy-filtered or selected electron imaging is one of the future directions of high-resolution electron microscopy HREM. In this paper, the characteristics and applications of energy-selected electron imaging at high-resolution for structure determinations are illustrated. It is shown that image contrast can be dramatically improved with the use of an energy filter. High-resolution chemical-sensitive imaging using ionization-loss electrons is demonstrated in studies of NiTi and AlTi multilayer thin films. It is also shown that the spatial resolution of energy-selected ionization edge electron images is dominated by the signal-to-noise ratio. Experimental parameters which may be selected to improve the signal-to-noise ratio are discussed.

Author(s):
Wang, Z. L. ; Van Heerden, D. ; Josell, D. ; Shapiro, A. J.
Author Organization(s):
NATIONAL INST OF STANDARDS AND TECHNOLOGY GAITHERSBURG MD
Descriptive Note:
Journal article
Supplementary Note:
Published in the Journal of Research of the National Institute of Standards and Technology, v102 n1 p1-13, Jan-Feb 1997.
Pagination:
0014

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Monitor Series:
USAF
 Subject Terms
Joint Capability Areas:
JCA_7.2.1_Mitigate Lethal Effects; JCA_7.2_Mitigate; JCA_7_Protection; JCA_6.3.3_Spectrum Management; JCA_6_Net Centric; JCA_6.3_Net Management; JCA_4.5.4_Requirements Definition; JCA_4.5_Operational Contract Support; JCA_8_Building Partnerships; JCA_5_Command and Control; JCA_8.2_Shape
Modernization Areas:
Microelectronics
Communities of Interest:
Air Platforms
Descriptor(s):
*TRANSMISSION ELECTRON MICROSCOPY, EXCITATION, ENERGY, ELECTRON SCATTERING, SIGNAL TO NOISE RATIO, THIN FILMS, ALUMINUM, NICKEL, TITANIUM, FILTERS, COMPTON SCATTERING, REPRINTS, HIGH RESOLUTION
Field(s)/Group(s):
Test Facilities, Equipment and Methods, Nuclear Physics and Elementary Particle Physics
Keyword(s):
HREM(HIGH RESOLUTION ELECTRON MICROSCOPY), AL TI(ALUMINUM TITANIUM), COMPOSITION SENSITIVE IMAGING, ELECTRON ENERGY LOSS SPECTROSCOPY, ENERGY FILTERING, CASTAING HENRY FILTERS, PEELS(PARALLEL DETECTION ELECTRON ENERGY LOSS SPECTROSCOPY), CCD(CHARGE COUPLED DEVICES), NI TI(NICKEL TITANIUM), GIF(GATAN IMAGE FILTERING), MGO(MAGNESIUM OXYGEN), MGO CUBES, SF(STACKING FAULTS), HAADF(HIGH ANGLE ANNULAR DARK FIELD IMAGING), HADF TEM(HIGH ANGLE HOLLOW CONE DARK FIELD TRANSMISSION ELECTRON MICROSCOPY), STEM(SCANNING TRANSMISSION ELECTRON MICROSCOPY)
Report Date:
1997 Jan 01
Creation Date:
2010 Oct 27