Experimental Study of EMP Upset Mechanisms in Analog and Digital Circuits

Outline and Motivation 1 Out-of-band frequency response in communications circuits a Effect of parasitic elements on network performance b Degradation in filter rejection ratios c EMP propagation on signal path d Need for wideband circuit characterization and verification throughout the communications network RF and IF path, mixer, AD, power vias, etc.. 2 Experimental study of device upset using direct RF injection a Identify RF characteristics that produce bit errors, latch-up b What are the EMP effects at the device level c Modulation and nonlinear circuit response. 3 Directions to pursue a Experiment b Modeling.