Scanning Probe Microscope

reportActive / Technical Report | Accession Number: ADA394926 | Open PDF

Abstract:

This DURIP allowed us to purchase a Digital Instruments Dimension 3100 Atomic Force Microscope AFM, which is a versatile tool that can serve dual functions, both as an AFM and a scanning-tunneling microscope STM . The AFM and the STM are separated units and are mounted on two different stages both of which minimize external noise and vibration. Within the purview of each of these units lie several modes of imaging. As an AFM, imaging is done in two modes namely the tapping mode and the contact mode. These modes have the capability of resolving step heights of a few angstroms and have a be done in several ways depending upon the kind of atoms that one is imaging.

Author(s):
Melloch, Michael R.
Author Organization(s):
PURDUE RESEARCH FOUNDATION LAFAYETTE IN
Descriptive Note:
Final technical rept. 1 Apr 1999-31 Mar 2001
Pagination:
0005

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AFRL-SR-BL-TR-01-0466
Contract/Grant Number(s):
F49620-99-1-0187
Task Number(s):
US
Project Number(s):
3484
Monitor Series:
TR-01-0466, AFOSR
 Subject Terms
Modernization Areas:
Microelectronics
Communities of Interest:
Advanced Electronics
Descriptor(s):
*SCANNING ELECTRON MICROSCOPES, SCANNING, VIBRATION, TUNNELING(ELECTRONICS), SUBSTRATES, ATOMS, ETCHING, IMAGES
Field(s)/Group(s):
Test Facilities, Equipment and Methods, Optics
Keyword(s):
STM(SCANNING TUNNELING MICROSCOPE), SCANNING TUNNELING MICROSCOPY, MOCVD(METAL ORGANIC CHEMICAL VAPOR DEPOSITION), PE61103D, WUAFRL3484US
Report Date:
2001 Mar 31
Creation Date:
2001 Oct 24