Acquisition of the Gatan Image Filter System and an Environmental Cell for an Existing Phillips CM-200 FEG-TEM

reportActive / Technical Report | Accession Number: ADA388327 | Open PDF

Abstract:

A Gatan Image Filter System for the Philips CM-2OO FEG-TEM was installed in the Imaging and Analysis Center at Princeton Materials Institute in 1995. This addition has strongly enhanced our ability to study advanced materials by obtaining two-dimensional elemental mapping at very high resolution nanometer range with short acquisition times seconds. In the past 5 years, we have made exciting progress in both research and education at Princeton and have made an impact in the materials science community by utilizing this state-of-the-art electron microscope equipped with the imaging filter system.

Author(s):
Aksay, Ilhan A. ; Yao, Nan ; Dabbs, Daniel M.
Author Organization(s):
PRINCETON UNIV NJ DEPT OF CHEMICAL ENGINEERING
Descriptive Note:
Final rept. 1 Aug 1996-21 Jan 1998
Supplementary Note:
DOI: 10.21236/ADA388327
Pagination:
0017

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AFRL-SR-BL-TR-01-0237
Contract/Grant Number(s):
F49820-96-1-0405
Monitor Series:
TR-01-0237, AFOSR/VA
 Subject Terms
Joint Capability Areas:
JCA_1.2_Force Preparation; JCA_1_Force Support; JCA_6_Net Centric; JCA_6.2.3_Core Enterprise Services; JCA_1.2.3_Educating; JCA_5_Command and Control; JCA_4.6_Engineering; JCA_5.3_Planning; JCA_6.2_Enterprise Services; JCA_3.2_Engagement; JCA_3_Force Application; JCA_3.2.1_Kinetic Means; JCA_6.1_Information Transport; JCA_1.2.1_Training
Modernization Areas:
Microelectronics
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*ELECTRON MICROSCOPY, *CARBON NANOTUBES, TWO DIMENSIONAL, ELECTRON MICROSCOPES, HIGH RESOLUTION, IMAGES, MAPPING, MATERIALS LABORATORIES
Field(s)/Group(s):
Test Facilities, Equipment and Methods, Textiles
Keyword(s):
MATERIALS CHARACTERIZATION, TRANSMISSION ELECTRON MICROSCOPY, ELEMENTAL ANALYSIS, ELEMENTAL MAPPING, NANOSCALE CHARACTERIZATION
Report Date:
2001 Feb 28
Creation Date:
2001 Apr 25