Laser Diode Assembly Testing and Characterization.
Abstract:
An investigation has been conducted to study the response of two Laser Diode Assembly LDA components over a range of nominal operating conditions. Each LDA was comprised of a multi-stripe gain guided laser diode array coupled to a length of multi-mode fiber. The components were tested over a temperature-current parameter space. The LDAs were modulated at a rate of 12.5 Mega Bits per Second with a 50 duty cycle. The results of this study could be used as a basis for a mitigation strategy to compensate for Bit Error Rates BER compromised by temperature variations and other effects for a spaceborne laser communications link.
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