High Temperature X-Ray Diffractometer for Advanced Materials Research.

reportActive / Technical Report | Accession Number: ADA319997 | Open PDF

Abstract:

The X-ray diffractometer system purchased under the grant consists of an X-ray generator and associated equipment for determination of degree of crystallinity, crystallite size and lattice distortion in nano-and micro-crystalline metals and composites identification of crystalline phases, precision measurement of lattice constants, and determination of phase transformation temperatures in metals, ceramics, and composites at 25-1400 degrees Celsius determination of grain orientations, preferred orientation, and crystallographic texture by Laue back reflection pole figure mapping.

Author(s):
Sastry, Shankar M. ; Buhro, William E.
Author Organization(s):
WASHINGTON UNIV ST LOUIS MO
Descriptive Note:
Final rept. 30 Sep 93-29 Dec 94,
Pagination:
0018

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AFOSR-TR-97-0042
Contract/Grant Number(s):
F49620-93-1-0518
Monitor Series:
TR-97-0042, AFOSR
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_6_Net Centric; JCA_6.3.3_Spectrum Management; JCA_4.5.4_Requirements Definition; JCA_4.5_Operational Contract Support; JCA_6.1.1_Wired Transmission; JCA_1_Force Support; JCA_5.3_Planning; JCA_6.3_Net Management; JCA_6.1_Information Transport; JCA_1.2_Force Preparation
Modernization Areas:
Quantum Science and Computing
Communities of Interest:
Air Platforms
Descriptor(s):
*X RAY DIFFRACTION, *POLYCRYSTALLINE, *DIFFRACTOMETERS, ALUMINUM ALLOYS, PHASE TRANSFORMATIONS, HIGH TEMPERATURE, CRYSTAL LATTICES, NICKEL ALLOYS, IRON ALLOYS, LATTICE DYNAMICS, GRAIN STRUCTURES(METALLURGY), TITANIUM ALLOYS, SCINTILLATION COUNTERS, MOLYBDENUM ALLOYS, SILICON ALLOYS, X RAY TUBES, VANADIUM ALLOYS, CRYSTAL SUBSTRUCTURE, GONIOMETERS, MONOCHROMATORS
Field(s)/Group(s):
Properties of Metals and Alloys, Crystallography
Report Date:
1995 Feb 25
Creation Date:
1997 Jan 29