Using Photothermal Deflection Techniques for Studying the Attenuations of Guided Waves Propagated in Optical Thin Films.

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Abstract:

A new experimental system, utilizing photothermal deflection techniques, does test measurements of guided wave propagation attenuation in optical thin films. Lessons are drawn from propagation attenuation in wave guidance optics in order to characterize the losses and qualities associated with high quality optical thin films. Experimental results clearly show that attenuation coefficients are capable of very sensitively and completely reflecting thin film properties and quality. AN

Author(s):
Liu, Xu
Author Organization(s):
NATIONAL AIR INTELLIGENCE CENTER WRIGHT-PATTERSON AFB OH
Supplementary Note:
Trans. of Yiqi Yibiao Xuebao, (China) v13 n3 p233-239, Aug 92.
Annotation:
Using Photothermal Deflection Techniques for Studying the Attenuations of Guided Waves Propagated in Optical Thin Films, --Translation.
Pagination:
0018

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
NAIC-ID(RS)T-0753-94
Monitor Series:
NAIC*
 Subject Terms
Joint Capability Areas:
JCA_5.3_Planning; JCA_5_Command and Control
Modernization Areas:
Microelectronics
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*THIN FILMS, *OPTICAL WAVEGUIDES, *PHOTOTHERMAL PROPERTIES, TEST AND EVALUATION, LIGHT SCATTERING, EXPERIMENTAL DESIGN, REFRACTIVE INDEX, DEFLECTION, OPTICAL MATERIALS, REFLECTION, LASER BEAMS, WAVE PROPAGATION, THERMAL CONDUCTIVITY, LIGHT TRANSMISSION, ATTENUATION, TRANSLATIONS, TRANSMISSION LOSS, CHINA, CHINESE LANGUAGE
Field(s)/Group(s):
Optics
Keyword(s):
FOREIGN REPORTS
Report Date:
1995 Apr 05