Observation of Thermal Electron Detachment from Cyclo-C4F8 in FALP experiments

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Abstract:

The methodology for use of a flowing afterglow-Langmuir probe apparatus to measure thermal electron detachment rate coefficients is described. We determined the thermal detachment rate coefficient 1010 or - 300s for cyclo-C4F-8 ions and the rate coefficient 1.6 or - 0.5 x 10exp -8cu cms for electron attachment of cyclo-C4F8 at 375 K. The sole ionic product of attachment is cyclo-C4F-8. The equilibrium constant for the attachment detachment reaction yields a free energy for attachment at 375 K of -0.63 or - 0.02 eV, from which we estimate the electron affinity O K value Of Cyclo-C4F8 to be about 0.63 eV. Electron attachment, Electron detachment, Cyclo perfluorobutane

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