A HIFX Electron-Beam Dosimetry System

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Abstract:

The U.S. Army Research Laboratory has developed a dosimetry system for use with the High-intensity Flash X-ray HIFX facility and the custom low- noise test fixture used to perform radiation tests of integrated circuits in vacuum. When the flash x-ray is used in its electron-beam mode, dose rates greater than 10exp13 radsSis are achievable. This dose rate is above the useful limit of more conventional dosimetric methods, such as thermoluminescent dosimeters TLDs. Our method, which uses chromel-constantan thermocouples to measure electron beam intensity, also eliminates the necessity of breaking vacuum between shots to replace dosimeters, a process that greatly reduces the number of shots performable per day. This paper describes the dosimetry system and the results of experiments and calculations that correlate thermocouple voltages and radiation dose. We also describe methods of varying the dose rate of the HIFX electron beam.

Author(s):
Ovrebo, Gregory K. ; Blomquist, Steven M. ; Murrill, Steven R.
Author Organization(s):
ARMY RESEARCH LAB ADELPHI MD
Descriptive Note:
Final rept. 1 Jan-31 Dec 1993
Pagination:
0023

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
ARL-TR-363
Monitor Series:
ARL**
 Subject Terms
Joint Capability Areas:
JCA_6.3.3_Spectrum Management; JCA_6_Net Centric; JCA_6.3_Net Management; JCA_1.3_Human Capital Management; JCA_1_Force Support; JCA_JCA_4.1.2_Sustain the Force; JCA_4.1_Deployment and Distribution; JCA_1.3.2_Personnel Management; JCA_1.2.5_Lessons Learned; JCA_1.2.7_Experimentation; JCA_6.1.1_Wired Transmission; JCA_3.2_Engagement; JCA_3_Force Application; JCA_5_Command and Control
Modernization Areas:
Microelectronics
Communities of Interest:
Energy and Power Technologies
Descriptor(s):
*RADIATION, *ELECTRON BEAMS, *HIGH INTENSITY, *DOSIMETRY, TEST AND EVALUATION, INTENSITY, VACUUM, DOSE RATE, DOSIMETERS, FLASHES, TEST FIXTURES, LOW NOISE, THERMOCOUPLES, SILICON, RATES, VOLTAGE, INTEGRATED CIRCUITS, X RAYS
Field(s)/Group(s):
Electrical and Electronic Equipment, Nuclear Instrumentation, Particle Accelerators
Keyword(s):
*HIGH INTENSITY FLASH X RAY, HIFX(HIGH INTENSITY FLASH X RAY), PE62120A
Report Date:
1994 Feb 01