Spatial Light Modulators (SLMs) Surface Quality

reportActive / Technical Report | Accession Number: ADA263249 | Open PDF

Abstract:

The phase modulating properties of spatial light modulators SLMs have been investigated for optical pattern recognition purposes for many years. An interferometric microscope was recently utilized to investigate the surface uniformity, and thus phase distortion, of several SLMs that are commercially available. These interferometric results are presented here and verify that the optical uniformity of SLMs should be considered when phase modulating properties of the devices are to be applied in optical systems.

Author(s):
Hudson, Tracy D.
Author Organization(s):
ARMY MISSILE COMMAND REDSTONE ARSENAL AL WEAPONS SCIENCE DIRECTORATE
Descriptive Note:
Final technical rept. 1 Jun-1 Sep 1992
Supplementary Note:
DOI: 10.21236/ADA263249
Pagination:
0016

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AMSMI/TR-RD-WS-93-3
Monitor Series:
AMSMI
 Subject Terms
Joint Capability Areas:
JCA_1.2_Force Preparation; JCA_1_Force Support; JCA_1.2.3_Educating; JCA_3.2_Engagement; JCA_3_Force Application; JCA_3.2.1_Kinetic Means; JCA_4.6_Engineering; JCA_5_Command and Control
Modernization Areas:
Microelectronics; AI and Machine Learning
Communities of Interest:
Weapons Technologies
Descriptor(s):
*OPTICAL CORRELATORS, *PATTERN RECOGNITION, *PHASE MODULATION, *LIGHT MODULATORS, LIQUID CRYSTALS, PHASE DISTORTION, OPTICAL INTERFEROMETERS, INTERFEROGRAMS
Field(s)/Group(s):
Electrooptical and Optoelectronic Devices, Optics
Keyword(s):
UNIFORMITY, SLM(SPATIAL LIGHT MODULATORS), FISCAL YEAR 93
Report Date:
1993 Mar 01