An Artifact Filter for Event-Related Potentials.

reportActive / Technical Report | Accession Number: ADA223900 | Open PDF

Abstract:

Scalp-surface recordings of event-related potentials ERPs are frequently contaminated by electrical artifacts. We describe a Fortran 77 computer program that examines ERP data for several types of electrical artifacts eyeblinks, voltages spikes, large local voltages, large overall voltages, amplifier saturation effects, and dead-amplifier effects. Where possible, the program compensates the ERP data for electrooculogram artifacts by time-domain cross-regression procedures. Keywords Performance assessment, Event-related potentials, Evoked potentials, Psychophysiology, ERP, Artifact detection, EEG, EOG, Eyeblinks, Voltage spikes, Absolute voltages, Root-mean- square voltages, RMS, Amplifier clipping, Saturation, Artifacts, Biomedical instrumentation. JG

Author(s):
Stanny, R. R. ; Lacour, S. J.
Author Organization(s):
NAVAL AEROSPACE MEDICAL RESEARCH LAB PENSACOLA FL
Descriptive Note:
Special rept.,
Supplementary Note:
DOI: 10.21236/ADA223900
Pagination:
0043

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
NAMRL-SR-90-2
Task Number(s):
MM33P30001
Project Number(s):
MM33P30
Monitor Series:
NAMRL
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_1.3_Human Capital Management; JCA_1_Force Support; JCA_1.3.2_Personnel Management; JCA_5.3_Planning; JCA_6_Net Centric; JCA_3.2_Engagement; JCA_3_Force Application; JCA_6.4.1_Secure Information Exchange; JCA_8_Building Partnerships
Modernization Areas:
Cyber
Communities of Interest:
Biomedical
Descriptor(s):
*BIOMEDICINE, DETECTION, ELECTRICAL PROPERTIES, SATURATION, INSTRUMENTATION, FILTERS, CONTAMINATION, ARTIFACTS, AMPLIFIERS, ELECTROENCEPHALOGRAPHY, SPIKES, PSYCHOPHYSIOLOGY, ELECTROOCULOGRAMS
Field(s)/Group(s):
Anatomy and Physiology
Keyword(s):
PE62233N, WU7001
Report Date:
1990 Apr 01