Characterization of Microstructure in Metallic and Composite Materials.

reportActive / Technical Report | Accession Number: ADA186193 | Open PDF

Abstract:

Drexel Universitys Department of Materials Engineering has acquired a state of the art optical metallograph and an image analysis system. The latter interfaces with the optical metallograph and a scanning electron microscope. The optical analysis system Model DV-4400 for interfacing with the Zeiss Metallograph is designed to perform image enhancement, feature measurement and classification, utilizing a conventional TV camera. Interface with the scanning electron the operator to perform quantitative image analysis directly from the specimen in the microscope. In addition, the unit can determine relative x-ray intensity classification on the basis of chemistry.

Author(s):
Lawley, A.
Author Organization(s):
DREXEL UNIV PHILADELPHIA PA DEPT OF MATERIALS ENGINEERING
Descriptive Note:
Final rept. 15 Dec 84-14 Dec 85,
Pagination:
0004

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AFOSR-TR-87-1328
Contract/Grant Number(s):
AFOSR-85-0045
Task Number(s):
A3
Project Number(s):
2917
Monitor Series:
TR-87-1328
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_5.3_Planning; JCA_4.6_Engineering
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*COMPOSITE MATERIALS, *METALS, *MICROSTRUCTURE, CHEMISTRY, ELECTRON MICROSCOPES, ELECTRONIC SCANNERS, ENGINEERING, IMAGE PROCESSING, MATERIALS, OPTICAL ANALYSIS, OPTICAL EQUIPMENT, OPTIMIZATION, QUANTITATIVE ANALYSIS, TELEVISION CAMERAS, X RAYS, ALLOYS, METALLOGRAPHY
Field(s)/Group(s):
Laminates and Composite Materials, Metallurgy and Metallography, Properties of Metals and Alloys
Keyword(s):
Scanning Electron Microscopy, PE61102F, WUAFOSR2917A3
Report Date:
1987 Aug 01