Electrostatic Discharge (ESD) Susceptibility of Electronic Devices

reportActive / Technical Report | Accession Number: ADA129151 | Open PDF

Abstract:

This book contains data on the electrostatic discharge susceptibility ESD of electronic devices. Detailed susceptibility data is presented along with the ESD classification in accordance with DOD-HDBK-263 for approximately 700 microcircuits and 500 discrete semiconductor devices. A discussion of various discharge models and failure mechanisms of ESD are also presented.

Author(s):
Denson, William K.
Author Organization(s):
RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY
Supplementary Note:
Prepared by IIT Research Inst., Chicago, IL. DOI: 10.21236/ADA129151
Pagination:
0343

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
RAC-VZAP-1
Contract/Grant Number(s):
F30602-81-C-0299
Monitor Series:
RADC
 Subject Terms
Joint Capability Areas:
JCA_6.1.3_Switching and Routing; JCA_6_Net Centric; JCA_5_Command and Control; JCA_5.3_Planning; JCA_6.1_Information Transport; JCA_5.3.2_Apply Situational Understanding; JCA_6.4.1_Secure Information Exchange; JCA_1_Force Support; JCA_1.3_Human Capital Management; JCA_1.3.2_Personnel Management; JCA_6.4_Information Assurance; JCA_6.2.3_Core Enterprise Services; JCA_6.2.1_Information Sharing; JCA_6.2.2_Computing Services; JCA_3.2_Engagement; JCA_3_Force Application; JCA_6.2_Enterprise Services; JCA_1.2.5_Lessons Learned; JCA_3.2.2_Non-Kinetic Means
Communities of Interest:
Advanced Electronics
Descriptor(s):
*ELECTRIC DISCHARGES, *ELECTRONIC EQUIPMENT, *INTEGRATED CIRCUITS, *MICROCIRCUITS, *SEMICONDUCTOR DEVICES, FAILURE(ELECTRONICS), MODELS, RELIABILITY
Field(s)/Group(s):
Electrical and Electronic Equipment, Electricity and Magnetism
Keyword(s):
ESD(ELECTROSTATIC DISCHARGE), MECHANISMS(FAILURE), SUSCEPTIBILITY(DISCHARGE)
Report Date:
1982 Jan 01