Advanced Electronic Technology.

reportActive / Technical Report | Accession Number: ADA092701 | Open PDF

Abstract:

The contents of this report deals with the Digital Integrated Circuits MNOS Memory, Restructurable VLSI, Silicon Processing and Testing and Instrumentation MOS Capacitance Test System. Reports on Advanced Electronic Technology Solid State Device Research, Quantum Electronics, Materials Research, Microelectronics and Analog Device Technology.

Author(s):
Mclaughlin, Alan J. ; Mcwhorter, Alan L.
Author Organization(s):
MASSACHUSETTS INST OF TECH LEXINGTON LINCOLN LAB
Descriptive Note:
Quarterly technical summary rept. 1 May-31 Jul 80,
Supplementary Note:
DOI: 10.21236/ADA092701
Pagination:
0027

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
ESD-TR-80-95
Contract/Grant Number(s):
F19628-80-C-0002
Project Number(s):
649L
Monitor Series:
TR-80-95
 Subject Terms
Joint Capability Areas:
JCA_1.2.7_Experimentation; JCA_1.2.3_Educating; JCA_5_Command and Control
Modernization Areas:
Microelectronics; Quantum Science and Computing
Communities of Interest:
Advanced Electronics
Descriptor(s):
*DIGITAL SYSTEMS, *INTEGRATED CIRCUITS, *METAL OXIDE SEMICONDUCTORS, *SOLID STATE ELECTRONICS, ELECTRONICS, MATERIALS, PROCESSING, TEST METHODS, SILICON, MICROELECTRONICS, QUANTUM ELECTRONICS, ANALOG SYSTEMS, SOLID STATE PHYSICS, CAPACITANCE
Field(s)/Group(s):
Electrical and Electronic Equipment, Solid State Physics
Keyword(s):
PE63250F
Report Date:
1980 Aug 15