A Computer-Automated Temperature Control System for Semiconductor Measurements.

reportActive / Technical Report | Accession Number: ADA079055 | Open PDF

Abstract:

A computer-automated temperature control system is described in this report to completely automate data acquisition for the characterization of electrical properties of semiconductor devices and materials. Temperature is monitored by a type T thermocouple embedded in a heat sink surrounding the sample. Liquid nitrogen provides a reference temperature for the thermocouple. Steady state is established by computer control of the current in a heater wire wrapped around a block of copper on which the solid state device is mounted. A proportional plus integral control is implemented as a computer.

Author(s):
Switzer, Roger Nohl ; Chan, Philip C. H. ; Sah, C. T.
Author Organization(s):
ILLINOIS UNIV AT URBANA-CHAMPAIGN DEPT OF ELECTRICAL ENGINEERING
Descriptive Note:
Final technical rept. 1 Apr 78-20 Aug 79,
Supplementary Note:
DOI: 10.21236/ADA079055
Pagination:
0063

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
SCIENTIFIC-2, TR-39
Contract/Grant Number(s):
F19628-77-C-0138
Task Number(s):
J2
Project Number(s):
2306
Monitor Series:
TR-79-292
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_5.6.1_Assess Compliance with Guidance; JCA_5.6_Monitor; JCA_6.1.1_Wired Transmission; JCA_6_Net Centric; JCA_6.1_Information Transport; JCA_1_Force Support; JCA_5.2_Understand; JCA_5.2.2_Develop Knowledge and Situational Awareness; JCA_5.3_Planning
Communities of Interest:
Energy and Power Technologies
Descriptor(s):
*CONTROL SYSTEMS, *COMPUTER APPLICATIONS, *TEMPERATURE CONTROL, THERMAL PROPERTIES, COMPUTER PROGRAMS, STABILITY, SEMICONDUCTOR DEVICES, FEEDBACK, DATA ACQUISITION, MONITORS, AUTOMATIC, THERMOCOUPLES, MINICOMPUTERS, HIGH SENSITIVITY
Field(s)/Group(s):
Test Facilities, Equipment and Methods
Keyword(s):
WURADC2306J226, PE61102F
Report Date:
1979 Nov 01