Radiation Hardened Microprocessor Technology Study.

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Abstract:

This report discusses four LSI technologies-NMOS, TTL, CMOS and I2L-relative to their current and projected capabilities in both the commercial and the radiation hardened markets. The state-of-the-art in radiation hardened digital electronics is described along with a discussion of design techniques that may be used to apply LSI to hardened systems. Finally, a preliminary analysis of radiation testing of a microprocessor bit slice is provided. Author

Author(s):
Spratt, J. P. ; Harbert, D. Z.
Author Organization(s):
QUESTRON CORP SAN DIEGO CALIF
Descriptive Note:
Final technical rept. Jun 77-Mar 78,
Pagination:
0117

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
RADC-TR-78-231
Contract/Grant Number(s):
F19628-77-C-0177
Task Number(s):
20
Project Number(s):
4600
Monitor Series:
TR-78-231
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_5.3_Planning; JCA_5.3.4_Develop Courses of Action; JCA_5.3.5_Analyze Courses of Action; JCA_5.3.3_Develop Strategy; JCA_6.1.3_Switching and Routing; JCA_6_Net Centric; JCA_6.1.1_Wired Transmission; JCA_6.1_Information Transport; JCA_5.5.2_Task; JCA_5.5_Direct; JCA_1_Force Support; JCA_5.2.3_Share Knowledge and Situational Awareness; JCA_5.2_Understand; JCA_1.2_Force Preparation; JCA_1.2.5_Lessons Learned; JCA_1.4.2_Health Service Delivery; JCA_1.4_Force Support; JCA_5.6.3_Assess Achievement of Objectives; JCA_5.6_Monitor; JCA_3.2_Engagement
Modernization Areas:
Microelectronics; Space
Communities of Interest:
Advanced Electronics
Descriptor(s):
*MICROPROCESSORS, *INTEGRATED CIRCUITS, *METAL OXIDE SEMICONDUCTORS, *RADIATION HARDENING, DIGITAL SYSTEMS, STATE OF THE ART, LOGIC CIRCUITS, N TYPE SEMICONDUCTORS, COMPLEMENTARY METAL OXIDE SEMICONDUCTORS, TRANSISTOR TRANSISTOR LOGIC, RADIATION TOLERANCE
Field(s)/Group(s):
Electrical and Electronic Equipment, Computer Hardware, Nuclear Radiation Shielding, Protection and Safety
Keyword(s):
*LSI(Large Scale Integration), NMOS(N channel MOS), I2L(Integrated Injection Logic), VLSI(Very Large Scale Integration), WURADC46002021, PE62702F
Report Date:
1978 Oct 01