Radiation Effects on Charge-Coupled Devices and other MOS Structures.

reportActive / Technical Report | Accession Number: ADA061309 | Open PDF

Abstract:

This report describes results of radiation effects studies on charge-coupled devices CCDs and other MOS structures. Emphasis is placed on determining the basic mechanisms of the interaction of radiation with such devices with a view toward gaining understanding of benefit to developers of radiation-tolerant devices. A study of neutron damage mechanisms in CCDs was performed with emphasis placed on investigation of dark current increases.

Author(s):
Srour, Joseph R. ; Othmer, Siegfried ; Chen, Susan C. ; Hartmann, Robert A.
Author Organization(s):
NORTHROP RESEARCH AND TECHNOLOGY CENTER PALOS VERDES PENINSULA CA
Descriptive Note:
Final rept. May 77-Apr 78,
Pagination:
0179

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
NRTC-78-27R, HDL-CR-78-134-1
Contract/Grant Number(s):
DAAG39-77-C-0134, MIPR-77-602
Task Number(s):
A007
Project Number(s):
Z99QAXT
Monitor Series:
CR-78-134-1
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_JCA_4.1.2_Sustain the Force; JCA_4.1_Deployment and Distribution; JCA_5.2_Understand; JCA_1.2.5_Lessons Learned; JCA_5.3_Planning; JCA_1_Force Support; JCA_6_Net Centric; JCA_1.2.7_Experimentation; JCA_6.1.3_Switching and Routing; JCA_6.1_Information Transport; JCA_1.2_Force Preparation; JCA_1.3_Human Capital Management; JCA_4.5.4_Requirements Definition; JCA_4.5_Operational Contract Support; JCA_1.3.2_Personnel Management; JCA_6.4.1_Secure Information Exchange
Communities of Interest:
Advanced Electronics
Descriptor(s):
*METAL OXIDE SEMICONDUCTORS, *RADIATION DAMAGE, *CHARGE COUPLED DEVICES, STRESSES, LOW TEMPERATURE, SEMICONDUCTOR DEVICES, SAPPHIRE, DRIFT, SILICON, GAMMA RAYS, BIAS, NEUTRONS, RADIATION HARDENING
Field(s)/Group(s):
Radioactivity, Radioactive Wastes and Fission Products, Solid State Physics
Keyword(s):
PE62704H, WU61, LPN HDL 236728
Report Date:
1978 Oct 01