Photoemission Electron Microscopy: Another Powerful Tool for the Microscopist.

reportActive / Technical Report | Accession Number: ADA053860 | Open PDF

Abstract:

Photoemission Electron Microscopy, largely unknown in the United States, is an actively employed technique in several European laboratories. This report described microscope design, image formation and contrast considerations, resolution and depth of information, and application. Photographs illustrate varying applications in metals, ceramics and semiconductors. Author

Author(s):
Sosin, A.
Author Organization(s):
OFFICE OF NAVAL RESEARCH LONDON (ENGLAND)
Descriptive Note:
Technical rept.,
Pagination:
0020

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
ONRL-R-14-77
 Subject Terms
Joint Capability Areas:
JCA_3.2_Engagement; JCA_3_Force Application; JCA_3.2.1_Kinetic Means; JCA_4.6_Engineering; JCA_4.6.1_General Engineering; JCA_5_Command and Control
Modernization Areas:
Microelectronics
Communities of Interest:
Energy and Power Technologies
Descriptor(s):
*ELECTRON MICROSCOPY, *PHOTOELECTRIC EMISSION, METALS, CONTRAST, SURFACE ANALYSIS, CRYSTAL STRUCTURE, SEMICONDUCTORS, CERAMIC MATERIALS, TOPOGRAPHIC MAPS, THERMIONIC EMISSION, MERCURY LAMPS
Field(s)/Group(s):
Test Facilities, Equipment and Methods
Report Date:
1977 Dec 22