A Reflectometer Facility for the Measurement of Transmission and Reflection of Light at Normal Incidence.

reportActive / Technical Report | Accession Number: ADA046439 | Open PDF

Abstract:

A reflectometer facility has been developed to measure the normal incidence transmission and reflection of light from flat surfaces. The reflectometer is used to aid the study of the optical properties of thin film systems and some measurements are used to calculate the optical constants of substrates and thin films. The reflectometer facility and the procedure for alignment of the reflectometer is described. Author

Author(s):
Venning, J. R.
Author Organization(s):
WEAPONS RESEARCH ESTABLISHMENT SALISBURY (AUSTRALIA)
Descriptive Note:
Technical rept.,
Pagination:
0035

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
WRE-TR-1711(A)
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_4.6_Engineering; JCA_4.6.1_General Engineering; JCA_5.3_Planning; JCA_5.3.3_Develop Strategy; JCA_5.3.4_Develop Courses of Action; JCA_5.3.5_Analyze Courses of Action; JCA_5.5.2_Task; JCA_5.5_Direct
Modernization Areas:
Microelectronics
Communities of Interest:
Advanced Electronics
Descriptor(s):
*REFLECTOMETERS, THIN FILMS, SUBSTRATES, TRANSMITTANCE, SURFACES, COEFFICIENTS, PLANAR STRUCTURES, LIGHT TRANSMISSION, VISIBLE SPECTRA, REFLECTANCE, RADIOMETERS, AUSTRALIA, ZIRCONIUM OXIDES, AUTOMATIC GAIN CONTROL
Field(s)/Group(s):
Optics
Report Date:
1977 Feb 01