Sem Imaging of Crystal Surfaces using Diffracted Beams,

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Abstract:

Additional information regarding the structure of the surfaces of crystals may be obtained by the use of diffracted beams to form SEM images. Variations of diffracted beam intensities are produced both by surface topography and also by variations in the orientation or composition of the crystal. Image intensities are therefore sensitive indicators of chemical reactions, impurities, crystal imperfections or crystal distortion. A medium energy diffraction-SEM system with an ultra-high vacuum specimen environment has been built and used to demonstrate these possibilities Cowley, et. al., Rev. Sci. Instr 46. 1975, 826-29. This instrument has been applied to the study of the structures of various crystal surfaces. A new surface phase observed to grow on oxidized copper single crystals at about 500 C is attributed to the precipitation of dissolved silver. For a mosaic crystal of pyrolytic graphte diffraction images show clearly the mosaic structure and the presence of crystal defects and allow interpretation of electron channeling effects observed in secondary electron images. Author

Author(s):
Landry, J. D. ; Hembree, G. G. ; Nielsen, P. E. Hojlund ; Cowley, J. M.
Author Organization(s):
ARIZONA STATE UNIV TEMPE DEPT OF PHYSICS
Supplementary Note:
Presented at the Annual Scanning Electron Microscope Symposium (9th) Apr 76, Chicago, Ill.
Pagination:
0010

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AFOSR-TR-76-0939
Contract/Grant Number(s):
AF-AFOSR-1996-71
Task Number(s):
976102
Project Number(s):
AF-9761
Monitor Series:
TR-76-0939
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*ELECTRON MICROSCOPES, *ELECTRONIC SCANNERS, *SINGLE CRYSTALS, *SURFACE PROPERTIES, CHEMICALS, CRYSTAL LATTICES, ORIENTATION(DIRECTION), IMPURITIES, ELECTRON BEAMS, DIFFRACTION, COPPER, SILVER, PYROLYTIC GRAPHITE
Field(s)/Group(s):
Crystallography, Particle Accelerators
Keyword(s):
SEM(Scanning electron microscopy), Scanning electron microscopy
Report Date:
1976 Jan 01