Storage Reliability of Missile Materiel Program. Monolithic Bipolar SSI/MSI Linear Integrated Circuit Analysis.

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Abstract:

This report documents findings on the non-operating reliability of monolithic bipolar SSIMSI linear integrated circuits. Real time storage and accelerated testing results were analyzed and integrated to develop a non-operating reliability prediction model. Failure mechanisms are also discussed in detail. This information is part of a research program being conducted by the U. S. Army Missile Command, Redstone Arsenal, Alabama. The objective of this program is the development of non-operating storage reliability prediction and assurance techniques for missile materiel. Author

Author(s):
Malik, Dennis F.
Author Organization(s):
RAYTHEON CO HUNTSVILLE ALA LIFE CYCLE ANALYSIS DEPT
Descriptive Note:
Final rept. Jun 74-Jun 76,
Supplementary Note:
See also Rept. no. LC-76-IC1, AD-A026 123.
Pagination:
0070

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
LC-76-IC2
Contract/Grant Number(s):
DAAH01-74-C-0853
 Subject Terms
Joint Capability Areas:
JCA_3.2_Engagement; JCA_3_Force Application; JCA_3.2.1_Kinetic Means
Communities of Interest:
Weapons Technologies
Descriptor(s):
*INTEGRATED CIRCUITS, *RELIABILITY(ELECTRONICS), *GUIDED MISSILE COMPONENTS, MATHEMATICAL PREDICTION, MICROELECTRONICS, MONOLITHIC STRUCTURES(ELECTRONICS), BIPOLAR SYSTEMS
Field(s)/Group(s):
Electrical and Electronic Equipment, Manufacturing and Industrial Engineering and Control of Production Systems, Guided Missiles
Keyword(s):
Failure mechanisms, Linear circuits, SSI(Small scale integration), MSI(Medium scale integration), Small scale integration, Medium scale integration, Storage temperature
Report Date:
1976 May 01