SETE Workshop Proceedings. Advanced Techniques for Automatic Testing and Built in Test Equipment (BITE) for Test, Measurement and Diagnostic Equipment (TMDE),

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Abstract:

The presentations made during this two day meeting reflected in summary fromat the pertinent research and development activities in automation and built in test sponsored by DOD, NASA, the Department of Commerce, industry and academia.

Author(s):
Goodman, David M.
Author Organization(s):
FLEET MISSILE SYSTEMS ANALYSIS AND EVALUATION GROUP ANNEX CORONA CALIF
Pagination:
0348

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
GIDEP-347.10.00.00-X1-09
Project Number(s):
SETE-3/76
Monitor Series:
347.10.00.00-X1-09
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*TEST EQUIPMENT, *WORKSHOPS, ELECTRONIC EQUIPMENT, TEST METHODS, MEASURING INSTRUMENTS, DIAGNOSTIC EQUIPMENT, AUTOMATIC
Field(s)/Group(s):
Test Facilities, Equipment and Methods
Keyword(s):
Built in test equipment
Report Date:
1974 Feb 01