Optical Materials Characterization

The authors have measured the following parameters of chemical vapor deposited polycrystalline ZnSe CVD ZnSe Refractive index and change of index of refraction with temperature dndT over the wavelength range 0.5 micrometers to 18 micrometers using the method of minimum deviation the coefficient of linear thermal expansion and dndT at 10.6 micrometers using Fizeau interferometry and the elastic moduli and photoelastic moduli using Fizeau and Twyman-Green interferometry. A sensitive technique has been developed for measuring stress-optical constants of materials that exhibit a small stress- optical effect.