Calibration for Medium Resolution Off-Axis Electron Holography Using a Flexible Dual-Lens Imaging System in a JEOL ARM 200F Microscope

reportActive / Technical Report | Accession Number: AD1094095 | Open PDF

Abstract:

In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35 nm to2.5 m. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing and versus fringe width W. The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.

Author(s):
Cantu-valle, Jesus ; Ruiz-zepeda, Francisco ; Mendoza-santoyo, Fernando ; Jose-yacama, Miguel ; Ponce, Arturo
Author Organization(s):
University of Texas at San Antonio San Antonio United States
Descriptive Note:
Journal Article - Open Access
Supplementary Note:
Ultramicroscopy , 147, 01 Jan 0001, 01 Jan 0001,
Pagination:
0010

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release;

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
64756-MS-REP.9
Monitor Series:
64756-MS-REP.9
 Subject Terms
Joint Capability Areas:
JCA_6_Net Centric; JCA_1_Force Support; JCA_5_Command and Control; JCA_6.1_Information Transport; JCA_8_Building Partnerships
Modernization Areas:
Microelectronics
Communities of Interest:
Biomedical
Descriptor(s):
electron microscopes, metallic nanoparticles, holography, calibration
Field(s)/Group(s):
Holography, Optics
Keyword(s):
Electron holography, electron optics, dual lens imaging, phase reconstruction, metallic nanoparticles
Report Date:
2014 Jun 30
Creation Date:
2020 Mar 27