Introducing a Trust Metric Foundation and Deriving Trust-for-Buck

reportActive / Technical Report | Accession Number: AD1076093 | Open PDF

Abstract:

This study defines a flexible quantitative metric for measuring trust-related aspects across a broad range of domains and a means of using that foundation to derive domain-specific measurements. A Trust Basis Metric is described here along with examples that build on its foundation to measure assurances and identify cost-effective trust-enhancing investments. Our primary motivation in performing this study was to quantitatively determine the best increase in trust per dollar Trust-for-Buck when investing in current device manufacture and distribution flows for microelectronic components.

Author(s):
Harper, Scott ; Graf, Jonathan ; Batchelor, Whitney ; Dunham, Timothy ; Athanas, Peter
Author Organization(s):
Virginia Polytechnic Institute and State University Blacksburg United States
Descriptive Note:
Conference Paper
Supplementary Note:
GOMACTech Conference (GOMACTech 19) , 25 Mar 2019, 28 Mar 2019, See also AD1074821 - GOMACTech Conference (GOMACTech 19) "Artificial Intelligence and Cyber Security: Challenges and Opportunities for the Government" held in Albuquerque, NM 25-28 March 2019.
Pagination:
0006

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release;

RECORD

Collection: TR
Subject Terms
Joint Capability Areas:
JCA_6_Net Centric; JCA_6.4_Information Assurance; JCA_5_Command and Control; JCA_5.3_Planning; JCA_5.3.2_Apply Situational Understanding; JCA_7.2.1_Mitigate Lethal Effects; JCA_7.2_Mitigate; JCA_7_Protection; JCA_1_Force Support; JCA_6.2.1_Information Sharing; JCA_6.2.2_Computing Services; JCA_1.2.5_Lessons Learned; JCA_1.2_Force Preparation; JCA_4.1_Deployment and Distribution; JCA_6.2_Enterprise Services
Modernization Areas:
Microelectronics
Communities of Interest:
Advanced Electronics
Descriptor(s):
manufacturing, vulnerability, risk, printed circuits, fabrication, circuit boards, assembly, supply chain, printed circuit boards, availability, data set, digital data, systems engineering, game theory
Field(s)/Group(s):
Electrical and Electronic Equipment
Keyword(s):
Trust, Assurance, Microelectronics, Metrics, SCAP(Security Content Automation Protocol), CVE(Common Vulnerabilities and Exposures), CWE(Common Weakness Enumeration), DPA(Differential Power Analysis)
Report Date:
2019 Mar 25
Creation Date:
2019 Jul 08