Computerized RADC Reliability Notebook (GE-Honeywell/635/645/TSS/Fortran IV).

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Abstract:

Conversational computer programs which enable the reliability engineer to mechanically apply the 3RADC Reliability Notebook, Volume II, September 1967, in obtaining the failure rates of piece parts are presented. Little, if any, knowledge of computer programs or the Notebook is required of the user in applying the programs. Author

Author(s):
Lyne, George W.
Author Organization(s):
ROME AIR DEVELOPMENT CENTER GRIFFISS AFB NY
Descriptive Note:
Technical rept.,
Pagination:
0113

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
RADC-TR-71-254
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
(*RELIABILITY(ELECTRONICS), COMPUTER PROGRAMS), FAILURE(ELECTRONICS), CARBON RESISTORS, VARIABLE RESISTORS, CAPACITORS, RELAYS, ELECTRIC CONNECTORS, ELECTRIC SWITCHES, SEMICONDUCTOR DEVICES, INTEGRATED CIRCUITS, PRINTED CIRCUITS, ENVIRONMENTAL TESTS, STRESSES
Field(s)/Group(s):
Electrical and Electronic Equipment, Computer Programming and Software, Manufacturing and Industrial Engineering and Control of Production Systems
Keyword(s):
COMPUTER AIDED ANALYSIS, FILM RESISTORS, FORTRAN, FORTRAN 4 PROGRAMMING LANGUAGE, WIRE WOUND RESISTORS
Report Date:
1971 Nov 01