Operation of Reliability Analysis Center

reportActive / Technical Report | Accession Number: AD0864892 | Open PDF

Abstract:

The Reliability Analysis Center is a service for the dissemination of reliability and experience information on microelectronic devices. It is administered for the Department of Defense by the Rome Air Development Center, Air Force Systems Command, and operated for that Center by IIT Research Institute. Its objective is to improve electronic systems reliability through a more fundamental understanding of microcircuit reliability factors and failure mechanisms.

Author(s):
Lauffenburger, Harold A.
Author Organization(s):
IIT RESEARCH INST CHICAGO IL
Descriptive Note:
Final technical rept. 1 Aug 1968-31 Aug 1969
Pagination:
0120

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
IITRI-E6122-FR, RADC-TR-69-360
Contract/Grant Number(s):
F30602-69-C-0101
Project Number(s):
AF-6528
Monitor Series:
TR-69-360, RADC
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_6.4.1_Secure Information Exchange; JCA_5.2_Understand; JCA_5.2.3_Share Knowledge and Situational Awareness; JCA_6_Net Centric; JCA_5.3_Planning; JCA_6.4_Information Assurance; JCA_3_Force Application; JCA_3.2_Engagement; JCA_3.2.1_Kinetic Means; JCA_8_Building Partnerships; JCA_6.1_Information Transport; JCA_8.2_Shape; JCA_1_Force Support; JCA_6.3_Net Management; JCA_4.6_Engineering; JCA_1.2.5_Lessons Learned; JCA_1.2_Force Preparation; JCA_4.2_Supply; JCA_8.2.1_Partner with Governments and Institutions; JCA_8.1_Communicate
Communities of Interest:
Advanced Electronics
Descriptor(s):
*RELIABILITY(ELECTRONICS), *MINIATURE ELECTRONIC EQUIPMENT, *TECHNICAL INFORMATION CENTERS, DATA PROCESSING, BIBLIOGRAPHIES, REPORTS, DOCUMENTS, MICROELECTRONICS, INFORMATION RETRIEVAL, OPERATION, CIRCUITS, FAILURE(ELECTRONICS)
Field(s)/Group(s):
Information Science, Manufacturing and Industrial Engineering and Control of Production Systems
Keyword(s):
*MICROELECTRONICS, *RAC(RELIABILITY ANALYSIS CENTER), *RELIABILITY ANALYSIS CENTER, MICROELECTRONICS
Report Date:
1970 Jan 01