Composition and Structure of Chemically Deposited PbS.

reportActive / Technical Report | Accession Number: AD0854160 | Need Help?

Abstract:

In a study of the fundamental properties of chemically deposited lead sulfide, new instrumental techniques-scanning electron microscopy SEM and mass spectroscopy--were applied to the analysis of structure and composition. Lead sulfide samples were prepared using the Newburgh method for chemical sensitization. Some preliminary results are presented, including the first SEM micrographs of these thin films. Author

Author(s):
Ritchie, Milton H. ; Drew, Charles M.
Author Organization(s):
NAVAL WEAPONS CENTER CHINA LAKE CA
Descriptive Note:
Progress rept.,
Supplementary Note:
Presented at the IRIS Detector Specialty Group Meeting, Ft. Monmouth, N. J., Jun 66.
Pagination:
0014

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
NWC-Technical Article-19, NWC-TP-4686
Task Number(s):
737102
Project Number(s):
R361-00-000/216-1/F008-98-16
Monitor Series:
502.34.47.00-X7-01
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
(*INFRARED DETECTORS, LEAD COMPOUNDS), (*SULFIDES, CHEMICAL PROPERTIES), ELECTRON MICROSCOPY, PHOTOMICROGRAPHY, SPECTRUM ANALYZERS, FILMS, SURFACE PROPERTIES
Field(s)/Group(s):
Physical Chemistry, Infrared Detection and Detectors
Keyword(s):
THIN FILMS
Report Date:
1969 Apr 01