TEST PROGRAM ON SILICON MESA VARACTORS AND PIN DIODES.

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Abstract:

No Abstract Identified

Author(s):
Cranna, N. G.
Author Organization(s):
MICROWAVE ASSOCIATES INC BURLINGTON MA
Descriptive Note:
Final technical rept. 1 Jan 67-30 Jun 68,
Pagination:
0300

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AFML-TR-68-236
Contract/Grant Number(s):
F33615-67-C-1307
Project Number(s):
AF-9-526
Monitor Series:
TR-68-236
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*SEMICONDUCTOR DIODES, SILICON, RELIABILITY(ELECTRONICS), MICROWAVE FREQUENCY, LIFE EXPECTANCY(SERVICE LIFE), STRESSES, RADIOFREQUENCY POWER, VOLTAGE, VARACTOR DIODES, TEMPERATURE, LEAKAGE(ELECTRICAL), SPECIFICATIONS
Field(s)/Group(s):
Electrical and Electronic Equipment
Keyword(s):
*PIN DIODES
Report Date:
1968 Jun 30