PIEZOELECTRIC THIN FILM TRANSDUCERS.

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Abstract:

The methods by which CdS vapor deposition procedures and equipment have been improved are discussed. Techniques for multilayer transducers are described, together with microwave acoustic attenuation measurements on various dielectric and semiconductor materials. A method of modifying a standard evaporator for CdS film fabrication is given. Film thickness measurement procedures are reviewed and theoretical discussions are included to account for the attenuation measurements made. Author

Author(s):
De Klerk, John
Author Organization(s):
WESTINGHOUSE RESEARCH LABS PITTSBURGH PA
Descriptive Note:
Final rept. 1 Oct 64-30 Sep 67,
Pagination:
0214

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
67-9J6-WAVES-R1, AFCRL-67-0610
Contract/Grant Number(s):
AF 19(628)-4372
Task Number(s):
563503
Project Number(s):
AF-5635
Monitor Series:
67-0610
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
(*PIEZOELECTRIC TRANSDUCERS, MANUFACTURING), MAGNESIUM COMPOUNDS, LITHIUM FLUORIDES, CADMIUM SULFIDES, ZINC SULFIDES, QUARTZ, SILICON, FLUORIDES, ATTENUATION, PIEZOELECTRIC EFFECT, VAPOR PLATING, VACUUM APPARATUS, THICKNESS, CRYSTAL STRUCTURE, FILMS
Field(s)/Group(s):
Test Facilities, Equipment and Methods, Solid State Physics
Keyword(s):
ELASTIC PROPERTIES, THIN FILMS
Report Date:
1967 Oct 31