RESEARCH AND DEVELOPMENT PROGRAM INTRINSIC RELIABILITY SUBMINIATURE CERAMIC CAPACITORS.

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Abstract:

It appears that markedly non-ohmic current-voltage releationships for C67 MONOLYTHIC capacitors indicate inferior life test capability because of Schottky emission as surmised from the close fit of the data to Dushman-Richardson-Schottky equation. On the basis of the 1200-piece life test matrix, it appears that short-life MONOLYTHIC capacitors can be identified by a voltage screening procedure. Data on a preproduction sampling of 0.033 micro f C67 Case Size I MONOLYTHIC capacitors containing 1.0 mil dielectrics are presented. Author

Author(s):
Phillips, H. F. ; Prokopowicz, T. I.
Author Organization(s):
SPRAGUE ELECTRIC CO NORTH ADAMS MA
Descriptive Note:
Quarterly rept. no. 16, 1 Mar-31 May 66,
Pagination:
0042

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
DA-36-039-sc-90705
Project Number(s):
DA-1P6-22001-A-057
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*SUBMINIATURE ELECTRONIC EQUIPMENT), (*CERAMIC CAPACITORS, BARIUM COMPOUNDS, TITANATES, DIELECTRICS, RELIABILITY(ELECTRONICS), TEST METHODS, VOLTAGE, TEMPERATURE, FAILURE(ELECTRONICS), MATHEMATICAL PREDICTION
Field(s)/Group(s):
Electrical and Electronic Equipment
Report Date:
1966 May 31