Conduction Mechanisms in Thick Film Microcircuits

reportActive / Technical Report | Accession Number: AD0747980 | Open PDF

Abstract:

Preliminary results on resistor microstructure are presented and their correlation with the proposed model discussed. The study of RuO2-glass composites led to the conclusion that the difference in thermal expansion between the RuO2 and the glass is a minor factor in controlling resistor TCR. Preliminary studies of the resistance changes during firing of a thick film resistor are described. Evaluation of the performance of the screen printing machine has established that the variations in resistor value which can be expected from this phase of the process will be less than plus or minus 5.

Author(s):
Vest, R. W.
Author Organization(s):
PURDUE RESEARCH FOUNDATION LAFAYETTE IN
Descriptive Note:
Semi-annual technical rept. 1 Jan-30 Jun 1972
Pagination:
0050

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
DAHC15-70-G-7, ARPA ORDER-1642
Monitor Series:
DARPA
 Subject Terms
Joint Capability Areas:
JCA_6_Net Centric; JCA_1.2.7_Experimentation; JCA_6.1_Information Transport; JCA_5_Command and Control; JCA_5.3_Planning; JCA_1_Force Support
Modernization Areas:
Microelectronics
Communities of Interest:
Energy and Power Technologies
Descriptor(s):
*CIRCUITS, *FIXED RESISTORS, DIOXIDES, ELECTRICAL RESISTANCE, FILMS, GLASS, MICROELECTRONICS, MICROSTRUCTURE, RUTHENIUM COMPOUNDS
Field(s)/Group(s):
Electrical and Electronic Equipment
Keyword(s):
THICK FILM RESISTORS, THICK FILMS
Report Date:
1972 Aug 01