Electron Spectrometer for Surface Analysis,

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Abstract:

An electron spectrometer of the LEED-Auger type was installed n the authors laboratory. The principle of operation, the significance of the measurements and possible applications are described. The capabilities of the technique are demonstrated by studying the clean and gas-covered silicon 111 surface. The results suggest that the spectrometer is a sensitive and versatile instrument for the analysis of surface composition, structure and properties. Author

Author(s):
Wei, P. S. P. ; Smith, A. W.
Author Organization(s):
BOEING SCIENTIFIC RESEARCH LABS SEATTLE WASH
Pagination:
0037

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
D1-82-1021, GIDEP-428.00.40.70-C6-01
Monitor Series:
428.00.40.70-C6-01
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
(*ELECTRON DIFFRACTION, *SPECTROMETERS), (*SURFACE PROPERTIES, ELECTRON DIFFRACTION), (*SILICON, ELECTRON DIFFRACTION), DESIGN, OPERATION, ADSORPTION
Field(s)/Group(s):
Test Facilities, Equipment and Methods, Crystallography
Keyword(s):
*ELECTRON DIFFRACTION, *LOW ENERGY, *AUGER ELECTRONS, *SPECTROSCOPY, *SURFACE CHEMISTRY
Report Date:
1970 Nov 01