Reliability Evaluation of Discrete Logic Circuits by Their Structure,

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Abstract:

The engineering method of calculating and evaluating the reliability of discrete logic circuits is outlined. This method includes generalized characterization of individual failures and breakdowns in circuits of standard logical units. It is stated that the reliability of a system as a whole is determined by a formula for the probability of infallible functioning of its separate elements. It is concluded that, in essence, once the probability of infallibility is determined for the circuit, the reliability of the discrete logic circuit can then be easily calculated. Author

Author(s):
Shcherbakov, N. S.
Author Organization(s):
FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO
Supplementary Note:
Edited machine trans. of Avtomatika i Vychislitelnaya Tekhnika (USSR) n4 p58-64 1968, by Edward Kray.
Annotation:
Reliability Evaluation of Discrete Logic Circuits by Their Structure--Translation.
Pagination:
0018

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
FTD-MT-24-132-70
Task Number(s):
DIAT680502
Project Number(s):
FTD-605020
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
(*LOGIC CIRCUITS, RELIABILITY(ELECTRONICS)), DESIGN, USSR
Field(s)/Group(s):
Electrical and Electronic Equipment
Keyword(s):
TRANSLATIONS
Report Date:
1970 Oct 20