RECENT DEVELOPMENTS IN ELLIPSOMETRY.

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Abstract:

Abstracts of 30 of the 37 papers presented at the Second International Conference on Ellipsometry, dealing with interface, surface, and thin film phenomena are included.

Author(s):
Bashara, N. M.
Author Organization(s):
NEBRASKA UNIV LINCOLN ELECTRICAL MATERIALS LAB
Descriptive Note:
Conference extended abstracts,
Supplementary Note:
Presented at International Conference on Ellipsometry (2nd), 7-9 Aug 68.
Pagination:
0138

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
Nonr-3718(01)
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
(*OPTICAL ANALYSIS, SYMPOSIA), ABSTRACTS, POLARIZATION, POLARISCOPES, FILMS, SURFACE PROPERTIES, INTERFACES
Field(s)/Group(s):
Physical Chemistry, Test Facilities, Equipment and Methods
Keyword(s):
*ELLIPSOMETRY, *POLARIMETRY
Report Date:
1968 Aug 09