A VACUUM INTEGRATING SPHERE FOR IN SITU REFLECTANCE MEASUREMENTS AT 77K FROM 0.5 TO 10 MICRONS

reportActive / Technical Report | Accession Number: AD0650072 | Open PDF

Abstract:

A modified integrating sphere with a spectral measurement range from 0.5 to 10 microns is described. This integrating sphere can be used for in situ reflectance measurements of low temperature surfaces at vacuum conditions. The techniques employed in measuring the spectral reflectance of CO2 cryodeposits are discussed. Reflectance data for CO2 cryodeposits on stainless steel and Cat-a-Lac Black substrates are presented as a function of wavelength and cryodeposit thickness. The reflectance characteristics of the spheres internal coating of NaCl are also presented.

Author(s):
Mccullough, B. A. ; Wood, B. E. ; Smith, A. M.
Author Organization(s):
ARNOLD ENGINEERING DEVELOPMENT CENTER ARNOLD AFB TN
Supplementary Note:
Prepared in cooperation with ARO, Inc., Tullahoma, Tenn. DOI: 10.21236/AD0650072
Pagination:
0027

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release
Distribution Statement:
Approved For Public Release; Distribution Is Unlimited.

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
AEDC-TR-67-10
Contract/Grant Number(s):
AF 40(600)-1200
Task Number(s):
895104
Project Number(s):
AF-8951, AROSW5703
Monitor Series:
AEDC
 Subject Terms
Joint Capability Areas:
JCA_5_Command and Control; JCA_6.4.1_Secure Information Exchange; JCA_6_Net Centric; JCA_4.6_Engineering
Modernization Areas:
Microelectronics
Communities of Interest:
Advanced Electronics
Descriptor(s):
*REFLECTOMETERS, CARBON DIOXIDE, CRYOGENICS, DEPOSITION, REFLECTION, SPACE SIMULATION CHAMBERS, SPHERES, VACUUM APPARATUS
Field(s)/Group(s):
Optics, Solid State Physics
Report Date:
1967 Apr 01