MICROELECTRONIC STUDIES, TASK 1. FEASIBILITY STUDY OF EMPIRICAL SCREENING METHODS, TASK 2. MODELING OF TRANSIENT BEHAVIOR.

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Abstract:

Screening techniques were studied which were potentially useful for silicon integrated circuits. Based on experiments with simple NOR gates, parameters measuring low-frequency noise and transfer characteristics appear to be feasible. Certain transient parameters were developed and studied for potential screening. The purpose was to extend the parameters to another type of circuit and determine whether a correlation existed between assumed changes in the internal parameters of a NOR gate and resulting changes of the characteristic parameters. Author

Author(s):
Peralta, B. C. ; Klapheke, J. W. ; Timberlake, A. B. ; Kopp, C. G. ; Easterday, J. L.
Author Organization(s):
BATTELLE MEMORIAL INST COLUMBUS OHIO COLUMBUS LABS
Descriptive Note:
Final rept. 25 Jun 65-25 Mar 66,
Pagination:
0194

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
N62269-3111
 Subject Terms
Modernization Areas:
Microelectronics
Communities of Interest:
No COI(s) Identified
Descriptor(s):
(*MICROELECTRONICS, *INTEGRATED CIRCUITS), RELIABILITY(ELECTRONICS), FAILURE(ELECTRONICS), TRANSIENTS, SILICON, PERFORMANCE(ENGINEERING)
Field(s)/Group(s):
Electrical and Electronic Equipment
Report Date:
1966 Mar 25