NOTES ON THE USE OF SEMICONDUCTOR STRAIN GAGES,

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Abstract:

The properties, advantages, and limitations of semiconducting strain gages as measurement tools are reviewed from the users point of view. Conventional and semiconductor gages are compared. Compensation techniques for nonlinearity and for temperature effects are described. Author

Author(s):
Davis, Harry J. ; Horn, Leon
Author Organization(s):
HARRY DIAMOND LABS WASHINGTON D C
Annotation:
Use of semiconductor strain gages.
Pagination:
0015

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
TR-1285
Project Number(s):
1P010501A008, 30300
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
SEMICONDUCTORS, SEMICONDUCTOR DEVICES, ELECTRICAL RESISTANCE, IMPURITIES, TEMPERATURE, VOLTAGE, SENSITIVITY, OPERATION
Report Date:
1965 Apr 30