SEMICONDUCTOR LASER ARRAY TECHNIQUES (SEMLAT).

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Abstract:

This report contains confirmation on the work done in the Second Quarter of the Semiconductor Laser Array Program. Further materials evaluation, construction techniques, and preliminary testing of two - diode arrays are discussed. Considerations leading to specifications of the required cryogenic equipment for testing the ultimate diode array are presented. Testing of single diodes to obtain matched pairs and the appropriate test system to detect microwave beat frequencies are described. Finally, thermal considerations leading to a proper selection of array diode spacing are presented. Author

Author(s):
Collins, N. E. ; Grubel, R. O. ; Kim, C. S. ; Raillard, H. ; Smith, J. M.
Author Organization(s):
GENERAL ELECTRIC CO SYRACUSE N Y
Descriptive Note:
Quarterly interim rept. no. 2,
Supplementary Note:
See also AD-609 064.
Annotation:
Semiconductor laser array techniques (semlat).
Pagination:
0051

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Report Number(s):
RADC-TR-64-548
Contract/Grant Number(s):
AF30 602 3414
Task Number(s):
450608
Project Number(s):
4506
Monitor Series:
TR-64-548
 Subject Terms
Modernization Areas:
Microelectronics
Communities of Interest:
Advanced Electronics
Descriptor(s):
*SEMICONDUCTOR DIODES, SEMICONDUCTOR DIODES, LASERS, GALLIUM ALLOYS, ARSENIC ALLOYS, CRYOGENICS, TEST EQUIPMENT, ELECTRONIC EQUIPMENT, OPTICAL EQUIPMENT
Keyword(s):
SEMLAT(SEMICONDUCTOR LASER ARRAY TECHNIQUE)
Report Date:
1965 Feb 01