THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUNDBASE COMPUTER SYSTEMS.

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Abstract:

Inland Testing Laboratories, in its Reliability Test Section, is designing and constructing a test facility for simultaneously testing more than 70,000 resistors, diodes and transistors, plus a substantial, but not yet determined quantity of other components. The quantities of components to be tested are extremely large and test measurements are to be made frequently therefore a conventional test system, using manual techniques for operation and measurement, is totally impractical. For this reason, a fully automated reliability test facility with provision for data-taking and recording is being designed. A program of Acceptance Testing is also being undertaken. This program includes the testing of a sampling of components from each lot manufactured, to verify compliance with Univacs component specifications. Related to, yet separate from the Acceptance Testing Program, is a program of Vendor Surveillance. This activity is conducted by Inland at vendors plants and includes observation of manufacturing processes, collection of data related to performance, characteristics, establishment of a system of lot identity and observation of the vendors acceptance test procedures. Author

Author(s):
No Author(s) Identified
Author Organization(s):
SPERRY RAND CORP ST PAUL MINN UNIVAC DEFENSE SYSTEMS DIV
Descriptive Note:
Quarterly progress rept. no. 2, 1 Jun-31 Aug 56,
Supplementary Note:
Subcontracted to Inland Testing Labs., Chicago, Ill. Legibility of this document is in part unsatisfactory. Reproduction has been made from the best available copy.
Annotation:
The reliability of electronic components for use in Remington Rand Univac Ground-Based Computer Systems.
Pagination:
0159

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
AF04 645 20
 Subject Terms
Modernization Areas:
Microelectronics
Communities of Interest:
Materials and Manufacturing Processes
Descriptor(s):
*DIGITAL COMPUTERS, *TEST FACILITIES, ELECTRONIC EQUIPMENT, RELIABILITY(ELECTRONICS), ELECTRONIC EQUIPMENT, COMPUTERS, TEST SETS, AUTOMATION, RESISTORS, DIODES, TRANSISTORS, LIFE EXPECTANCY(SERVICE LIFE), ENVIRONMENTAL TESTS, QUALITY CONTROL, FAILURE(MECHANICS), STATISTICAL ANALYSIS
Report Date:
1956 Aug 31