THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUND-BASED COMPUTER SYSTEMS. VOLUME IIIB: SIMULATED-USE LIFE-TEST DATA (DIODES).

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Abstract:

Presentation of Type HD2193 diode data for the simulated-use load-life experiment was designed to provide summarized statistics that could be used in a variety of computations which might arise in the design, operation, and maintenance of a ground-based computer system.

Author(s):
Brennan, J. E. ; Mace, A. E. ; Stember, L. H., Jr. ; Smith, R. L. ; Hassler, K. E.
Author Organization(s):
SPERRY RAND CORP ST PAUL MINN UNIVAC DEFENSE SYSTEMS DIV
Descriptive Note:
Final rept., Vol. 3B, 30 Apr 56-31 Mar 58,
Supplementary Note:
Subcontracted to Battelle Memorial Inst., Columbus, Ohio. Legibility of this document is in part unsatisfactory. Reproduction has been made from best available copy.
Pagination:
0140

Security Markings

DOCUMENT & CONTEXTUAL SUMMARY

Distribution:
Approved For Public Release

RECORD

Collection: TR
Identifying Numbers
Contract/Grant Number(s):
AF 04(645)-20
 Subject Terms
Communities of Interest:
No COI(s) Identified
Descriptor(s):
*ELECTRONIC EQUIPMENT, DIGITAL COMPUTERS, RELIABILITY(ELECTRONICS), SEMICONDUCTOR DIODES, SIMULATION, FAILURE(MECHANICS), STATISTICAL ANALYSIS, OPERATION, MAINTENANCE, GERMANIUM, LIFE EXPECTANCY(SERVICE LIFE), STRESSES, VOLTAGE, TEMPERATURE, PROBABILITY, TEST METHODS
Report Date:
1958 Mar 31